Difference between revisions of "Alkabani2008input"

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of benchmark instances demonstrate the efficiency of the proposed methods. For example, the leakage power consumption could be reduced in average by more than 10.4\%, when compared to the previously published IVC techniques that did not consider MV.
of benchmark instances demonstrate the efficiency of the proposed methods. For example, the leakage power consumption could be reduced in average by more than 10.4\%, when compared to the previously published IVC techniques that did not consider MV.
|institution=Rice University, Electrical and Computer Engineering Department
|institution=Rice University, Electrical and Computer Engineering Department
|month=
|year=2008
|title=Input Vector Control for Post-Silicon Leakage Current Minimization under Manufacturing Variations
|title=Input Vector Control for Post-Silicon Leakage Current Minimization under Manufacturing Variations
|entry=article
|entry=article
|date=2008-20-01
}}
}}

Revision as of 03:34, 4 September 2021

Alkabani2008input
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authorY. Alkabani and T. Massey and F. Koushanfar and M. Potkonjak
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institutionRice University, Electrical and Computer Engineering Department
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titleInput Vector Control for Post-Silicon Leakage Current Minimization under Manufacturing Variations
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year2008
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