Difference between revisions of "Alkabani2008input"
From ACES
(Import from BibTeX) |
m (Import from BibTeX) |
||
Line 7: | Line 7: | ||
of benchmark instances demonstrate the efficiency of the proposed methods. For example, the leakage power consumption could be reduced in average by more than 10.4\%, when compared to the previously published IVC techniques that did not consider MV. | of benchmark instances demonstrate the efficiency of the proposed methods. For example, the leakage power consumption could be reduced in average by more than 10.4\%, when compared to the previously published IVC techniques that did not consider MV. | ||
|institution=Rice University, Electrical and Computer Engineering Department | |institution=Rice University, Electrical and Computer Engineering Department | ||
|month= | |||
|year=2008 | |||
|title=Input Vector Control for Post-Silicon Leakage Current Minimization under Manufacturing Variations | |title=Input Vector Control for Post-Silicon Leakage Current Minimization under Manufacturing Variations | ||
|entry=article | |entry=article | ||
}} | }} |
Revision as of 03:34, 4 September 2021
Alkabani2008input | |
---|---|
entry | article |
address | |
annote | |
author | Y. Alkabani and T. Massey and F. Koushanfar and M. Potkonjak |
booktitle | |
chapter | |
edition | |
editor | |
howpublished | |
institution | Rice University, Electrical and Computer Engineering Department |
journal | |
month | |
note | |
number | |
organization | |
pages | |
publisher | |
school | |
series | |
title | Input Vector Control for Post-Silicon Leakage Current Minimization under Manufacturing Variations |
type | |
volume | |
year | 2008 |
doi | |
issn | |
isbn | |
url | |