Difference between revisions of "Dyer2011"
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|abstract=<p>Accurate characterization of spatial variation is essential for statistical performance analysis and modeling, post-silicon tuning, and yield analysis. Existing approaches for spatial modeling either assume that: (i) non-stationarities exist due to a smoothly varying trend component or that (ii) the process is stationary within regions associated with a predefined grid. While such assumptions may hold when profiling certain classes of variations, many studies now suggest that spatial variability is likely to be highly non-stationary. In order to provide spatial models for non-stationary process variations, we introduce a new hybrid spatial modeling framework that models the spatially varying random field as a union of non-overlapping rectangular regions where the process is assumed to be locallystationary. To estimate the parameters in our hybrid spatial model, we introduce a host of techniques for efficient detection of regions over which the process variations are locally-stationary. We verify our models and results on measurements collected from 65nm FPGAs.</p> | |abstract=<p>Accurate characterization of spatial variation is essential for statistical performance analysis and modeling, post-silicon tuning, and yield analysis. Existing approaches for spatial modeling either assume that: (i) non-stationarities exist due to a smoothly varying trend component or that (ii) the process is stationary within regions associated with a predefined grid. While such assumptions may hold when profiling certain classes of variations, many studies now suggest that spatial variability is likely to be highly non-stationary. In order to provide spatial models for non-stationary process variations, we introduce a new hybrid spatial modeling framework that models the spatially varying random field as a union of non-overlapping rectangular regions where the process is assumed to be locallystationary. To estimate the parameters in our hybrid spatial model, we introduce a host of techniques for efficient detection of regions over which the process variations are locally-stationary. We verify our models and results on measurements collected from 65nm FPGAs.</p> | ||
|pages=in press | |pages=in press | ||
|month=6 | |||
|year=2011 | |||
|booktitle=Design Automation Conference (DAC) | |booktitle=Design Automation Conference (DAC) | ||
|title=Hybrid Spatial Modeling of Non-Stationary Process Variations | |title=Hybrid Spatial Modeling of Non-Stationary Process Variations | ||
|entry=inproceedings | |entry=inproceedings | ||
| | |pdf=Dyer2011.pdf | ||
}} | }} |
Latest revision as of 02:43, 10 November 2021
Dyer2011 | |
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entry | inproceedings |
address | |
annote | |
author | Eva Dyer and Mehrdad Majzoobi and Farinaz Koushanfar |
booktitle | Design Automation Conference (DAC) |
chapter | |
edition | |
editor | |
howpublished | |
institution | |
journal | |
month | 6 |
note | |
number | |
organization | |
pages | in press |
publisher | |
school | |
series | |
title | Hybrid Spatial Modeling of Non-Stationary Process Variations |
type | |
volume | |
year | 2011 |
doi | |
issn | |
isbn | |
url | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5981935 |
Dyer2011.pdf |