Difference between revisions of "Alkabani2008input"
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of benchmark instances demonstrate the efficiency of the proposed methods. For example, the leakage power consumption could be reduced in average by more than 10.4\%, when compared to the previously published IVC techniques that did not consider MV. | of benchmark instances demonstrate the efficiency of the proposed methods. For example, the leakage power consumption could be reduced in average by more than 10.4\%, when compared to the previously published IVC techniques that did not consider MV. | ||
|institution=Rice University, Electrical and Computer Engineering Department | |institution=Rice University, Electrical and Computer Engineering Department | ||
|month= | |||
|year=2008 | |||
|title=Input Vector Control for Post-Silicon Leakage Current Minimization under Manufacturing Variations | |title=Input Vector Control for Post-Silicon Leakage Current Minimization under Manufacturing Variations | ||
|entry=article | |entry=article | ||
| | |pdf=Alkabani2008input.pdf | ||
}} | }} | ||
Latest revision as of 17:33, 9 November 2021
| Alkabani2008input | |
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| author | Y. Alkabani and T. Massey and F. Koushanfar and M. Potkonjak |
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| institution | Rice University, Electrical and Computer Engineering Department |
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| title | Input Vector Control for Post-Silicon Leakage Current Minimization under Manufacturing Variations |
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| year | 2008 |
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| Alkabani2008input.pdf | |
Email:
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Address:
Electrical & Computer Engineering
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Electrical & Computer Engineering
University of California, San Diego
9500 Gilman Drive, MC 0407
Jacobs Hall, Room 6401
La Jolla, CA 92093-0407
Lab Location: EBU1-2514
University of California San Diego
9500 Gilman Dr, La Jolla, CA 92093
University of California San Diego
9500 Gilman Dr, La Jolla, CA 92093