Difference between revisions of "Shamsi2008noninvasive"
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|abstract=We introduce a new methodology for noninvasive post-silicon characterization of the unique static power profile (tomogram) of each manufactured chip. The total chip leakage is measured for multiple input vectors in a linear optimization framework where the unknowns are the gate leakage variations. We propose compressive sensing for fast extraction of the unknowns since the leakage tomogram contains correlations and can be sparsely represented. A key advantage of our approach is that it provides leakage variation estimates even for inaccessible gates. Experiments show that the methodology enables fast and accurate noninvasive extraction of leakage power characteristics. | |abstract=We introduce a new methodology for noninvasive post-silicon characterization of the unique static power profile (tomogram) of each manufactured chip. The total chip leakage is measured for multiple input vectors in a linear optimization framework where the unknowns are the gate leakage variations. We propose compressive sensing for fast extraction of the unknowns since the leakage tomogram contains correlations and can be sparsely represented. A key advantage of our approach is that it provides leakage variation estimates even for inaccessible gates. Experiments show that the methodology enables fast and accurate noninvasive extraction of leakage power characteristics. | ||
|pages=341 - 346 | |pages=341 - 346 | ||
|month= | |||
|year=2008 | |||
|booktitle=ISLPED: Proceeding of international symposium on Low power electronics and design | |booktitle=ISLPED: Proceeding of international symposium on Low power electronics and design | ||
|title=Noninvasive leakage power tomography of integrated circuits by compressive sensing | |title=Noninvasive leakage power tomography of integrated circuits by compressive sensing | ||
|entry=inproceedings | |entry=inproceedings | ||
}} | }} | ||
Revision as of 03:34, 4 September 2021
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| author | D. Shamsi and P. Boufounos and F. Koushanfar |
| booktitle | ISLPED: Proceeding of international symposium on Low power electronics and design |
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| pages | 341 - 346 |
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| title | Noninvasive leakage power tomography of integrated circuits by compressive sensing |
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| year | 2008 |
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Email:
farinaz@ucsd.edu
farinaz@ucsd.edu
Address:
Electrical & Computer Engineering
University of California, San Diego
9500 Gilman Drive, MC 0407
Jacobs Hall, Room 6401
La Jolla, CA 92093-0407
Electrical & Computer Engineering
University of California, San Diego
9500 Gilman Drive, MC 0407
Jacobs Hall, Room 6401
La Jolla, CA 92093-0407
Lab Location: EBU1-2514
University of California San Diego
9500 Gilman Dr, La Jolla, CA 92093
University of California San Diego
9500 Gilman Dr, La Jolla, CA 92093