Difference between revisions of "Dyer2011"

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|abstract=<p>Accurate characterization of spatial variation is essential for statistical performance analysis and modeling, post-silicon tuning, and yield analysis. Existing approaches for spatial modeling either assume that: (i) non-stationarities exist due to a smoothly varying trend component or that (ii) the process is stationary within regions associated with a predefined grid. While such assumptions may hold when profiling certain classes of variations, many studies now suggest that spatial variability is likely to be highly non-stationary. In order to provide spatial models for non-stationary process variations, we introduce a new hybrid spatial modeling framework that models the spatially varying random field as a union of non-overlapping rectangular regions where the process is assumed to be locallystationary. To estimate the parameters in our hybrid spatial model, we introduce a host of techniques for efficient detection of regions over which the process variations are locally-stationary. We verify our models and results on measurements collected from 65nm FPGAs.</p>
|abstract=<p>Accurate characterization of spatial variation is essential for statistical performance analysis and modeling, post-silicon tuning, and yield analysis. Existing approaches for spatial modeling either assume that: (i) non-stationarities exist due to a smoothly varying trend component or that (ii) the process is stationary within regions associated with a predefined grid. While such assumptions may hold when profiling certain classes of variations, many studies now suggest that spatial variability is likely to be highly non-stationary. In order to provide spatial models for non-stationary process variations, we introduce a new hybrid spatial modeling framework that models the spatially varying random field as a union of non-overlapping rectangular regions where the process is assumed to be locallystationary. To estimate the parameters in our hybrid spatial model, we introduce a host of techniques for efficient detection of regions over which the process variations are locally-stationary. We verify our models and results on measurements collected from 65nm FPGAs.</p>
|pages=in press
|pages=in press
|month=6
|year=2011
|booktitle=Design Automation Conference (DAC)
|booktitle=Design Automation Conference (DAC)
|title=Hybrid Spatial Modeling of Non-Stationary Process Variations
|title=Hybrid Spatial Modeling of Non-Stationary Process Variations
|entry=inproceedings
|entry=inproceedings
|date=2011-Ju-01
|pdf=Dyer2011.pdf
}}
}}

Latest revision as of 03:43, 10 November 2021

Dyer2011
entryinproceedings
address
annote
authorEva Dyer and Mehrdad Majzoobi and Farinaz Koushanfar
booktitleDesign Automation Conference (DAC)
chapter
edition
editor
howpublished
institution
journal
month6
note
number
organization
pagesin press
publisher
school
series
titleHybrid Spatial Modeling of Non-Stationary Process Variations
type
volume
year2011
doi
issn
isbn
urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5981935
pdfDyer2011.pdf

File:Dyer2011.pdf

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Email:
farinaz@ucsd.edu
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Address:
Electrical & Computer Engineering
University of California, San Diego
9500 Gilman Drive, MC 0407
Jacobs Hall, Room 6401
La Jolla, CA 92093-0407
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Lab Location: EBU1-2514
University of California San Diego
9500 Gilman Dr, La Jolla, CA 92093