This paper presents an overview of hardware and Integrated Circuits (IC) metering methods. IC metering or hardware metering refers to tools, methodologies, and protocols that enable post-fabrication tracking of the ICs. Metering enables prevention and detection of overbuilt and counterfeit ICs in the dominant semiconductor contract-foundry model. Post-silicon identification and tagging of the individual ICs fabricated by the same mask is a precursor for metering: In passive metering, the ICs are specifically identified, either in terms of their functionality, or by other forms of unique identification. The identified ICs may be matched against their record in a pre-formed database that could reveal unregistered ICs or overbuilt ICs (in case of collisions). In active metering, not only the ICs are uniquely identified, but also parts of the chip’s functionality can be only accessed, locked (disabled), or unlocked (enabled) by the designer and/or IP rights owners using a high level knowledge of the design not transferred to the foundry. We provide a systematic overview of the field, along with a taxonomy of available methods.