Techniques for Foundry Identification

TitleTechniques for Foundry Identification
Publication TypeConference Paper
Year of Publication2014
AuthorsWendt, J. B., F. Koushanfar, and M. Potkonjak
Conference NameDesign Automation Conference (DAC)
Date PublishedJune, 2014
ISBN Number9781450327305
Abstract

Foundry identification is essential for many tasks including intellectual property protection, trust, and preventing counterfeiting. In this paper, we introduce statistical techniques for foundry detection, specifically for identifying from which foundry a particular chip originates from. The key idea is to consider the distributions of channel lengths and threshold voltages after employing a variant of SAT that extracts these two metrics. We apply Kolmogorov-Smirnov and other statistical tests for comparing the two empirical distributions. Finally, we study the effects of sample size and measurement error on the correct identification rate and establish an interval of confidence using resubstitution techniques.

URLdl.acm.org/citation.cfm?id=2593228
DOI10.1145/2593069.2593228
AttachmentSize
Foundry.pdf183.18 KB

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